;//'); define('UC_CHARSET', 'utf-8'); define('UC_IP', 'UC_IP'); define('UC_APPID', 'UC_APPID'); define('UC_PPP', '20'); MeiMei正妹交友論壇 - Powered by Discuz! Board Board logo

標題: Test protocol [打印本頁]

作者: bfg3rTEErt    時間: 2016-6-12 13:59     標題: Test protocol

output high current VDD = Voh,hogan sito ufficiale, 5V = ma 4.2V?
test parameters (normal temperature) test conditions of the maximum value of the typical value of the maximum unit
Party A according to Party B requirements, in the test will be PA4, Pa5, PA6, PA7 by the end of the 3.3k to pull up to 5 volts.
Party B think that under normal circumstances, the function test of the sample should be all passed, the test results should be in the range of the next table.
Party A Party B to use the functional test code file, under the 1MHz of the samples for testing and analysis.
if Party B is required to increase the content of the test analysis, it must be resolved through consultation with Party A. Party A:
input high current VDD = VIH, 5V = UA 5V?
output low voltage VDD = V 5V?
, Party B shall,sac goyard pas cher, after the signing of this agreement _____ days of chip data, test code is provided to Party A.
three, specific test requirements:
input low voltage VDD = V 5V?
output high level Voltage 5V = V VDD,hogan outlet?
quiescent operating current 5V = UA VDD,new balance 574 outlet?
0.4V< p > if the samples provided by Party B in% meet the above requirements,golden goose saldi, Party A shall to Party A shall issue a test analysis report, and provide detailed test data in the form of attachment (disk file,hogan rebel outlet, t t format).
Test protocol
output low current VDD = Vol,scarpe hogan outlet, 5V = ma
test protocol
B ____ function test code file (t______t format) two.
two, Party B provides packaged chips after _____ days, the test results submitted to the Party B.
dynamic operating current 5V = UA VDD?
Party B: ________________
< p > integrated circuit design research center (Party A) and (b) through friendly consultation,golden goose saldi, the project related technical indicators of the test problem reached agreement as follows: < p
input low current VDD = VIL, 5V = UA 0V?
input high voltage VDD = V 5V?
Party A in the test and analysis, should let ______ chip work in 5V.
________________
Party B if the test analysis report issued by Party A and test data have any doubt, must be in the two months from the date of the completion of the testing and analysis of Party A.
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